| Statistical Leakage Analysis Using The Deterministic Modeling of Cell Leakage Current | |
|---|---|
| Author | Jae Hoon Kim and Young Hwan Kim |
| Journal | International Conference on Electronics, Circuits, and Systems (ICECS), Sevilla, Spain |
| Impact factor | |
| Year | Dec. 9~12, 2012 |
| Category | |
| Link |
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6463529&…
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