Conference
CAD & SoC Design Laboratory

Conference

Stereo Confidence Metrics Using the Costs of Surrounding Pixels
Author Sanghun Kim, Dong-Gon Yoo, and Young Hwan Kim
Journal International Conference on Digital Signal Processing, Hong Kong, China
Impact factor pp. 98-103
Year Aug. 20, 2014~Aug. 23, 2014
Category
Link 관련링크 http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6900808 122회 연결

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