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CAD & SoC Design Laboratory

Conference

A Novel Design Methodology for Error-resilient Circuits in Near-threshold Computing
Author Jaemin Lee, Sunmean Kim, Youngmin Kim and Seokhyeong Kang
Journal Proc. IEEE International Conference on Consumer Electronics-Asia
Impact factor pp. 1-4
Year 2016
Category
File 첨부 A_novel_design_methodology_for_error-resilient_circuits_in_near-threshold_computing.pdf (607.4K) 8회 다운로드 DATE : 2025-08-05 15:50:55
Link 관련링크 https://ieeexplore.ieee.org/document/7804807 309회 연결

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