Conference
CAD & SoC Design Laboratory

Conference

Current Source Model of Combinational Logic Gates for Accurate Gate-level Circuit Analysis and Timing Analysis
Author Kai Chen, Young Hwan Kim
Journal VLSI Design, Automation and Test (VLSI-DAT 2015), Hsinchu, Taiwan
Impact factor
Year Apr. 27, 2015~Apr. 29, 2015
Category
Link 관련링크 http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=71145… 302회 연결

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