MAPG: Memory Access Power Gating Author Kwangok Jeong, Andrew B. Kahng, Seokhyeong Kang, Tajana S. Rosing and Richard Strong Journal Proc. IEEE/ACM Design, Automation and Test in Europe Impact factor pp. 1054–1059 Year 2012 Category . 목록 이전글Construction of Realistic Gate Sizing Benchmarks With Known Optimal Solutions 18.12.27 다음글Recovery-Driven Design: A Power Minimization Methodology for Error-Tolerant Processor Modules 18.12.27