| Investigation on the Non-Lognormal Leakage Characteristic of the Leakage Current Distribution under Process Variation | |
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| Author | W. Kim, H. S. Park, D. J. Hyun, Y. H. Kim, and K. T. Do |
| Journal | NEXT 2007, Seoul, Korea |
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| Year | Oct. 25~27, 2007 |
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