| Comparison of Characterization Methods for Statistical Analysis of SoC Designs | |
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| Author | W. Kim, D. J. Hyun, Y. H. Kim, and K. T. Do |
| Journal | ECTI-CON 2008, Krabi, Thailand |
| Impact factor | |
| Year | May. 14~16, 2008 |
| Category | |
| Link |
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=4600549
324회 연결
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