| Scan Order Decision Algorithm for Improving the Reliability of PDP Data Drivers | |
|---|---|
| Author | D. Y. Ka, J. W. Lee, M. J. Park, and Y. H. Kim |
| Journal | International SoC Design Conference (ISOCC) 2008, Busan, Korea |
| Impact factor | Vol. 01, pp. I-214-I-217 |
| Year | Nov. 24~25, 2008 |
| Category | IEEK Best Paper Award |
| Link |
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=4815610
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