Conference
CAD & SoC Design Laboratory

Conference

Incremental Statistical Static Timing Analysis with Gate Timing Yield Emphasis
Author J. W. Kim, W. Kim, H. S. Park, and Y. H. Kim
Journal 2008 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS 2008), Macau, China
Impact factor
Year Nov. 30~Dec. 3, 2008
Category
Link 관련링크 http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=4746197 376회 연결

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