| Assessment of Using Statistical Leakage Estimation at the Macro Level for VLSI Designs | |
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| Author | J. H. Kim, W. Kim, and Y. H. Kim |
| Journal | The 24th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2009), Jeju, Korea |
| Impact factor | |
| Year | Jul. 5~8, 2009 |
| Category | |
| Link |
http://www.dbpia.co.kr/Journal/ArticleDetail/NODE01590478
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