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Effect of Local Random Variation on Gate-Level Delay and Leakage Statistical Analysis
Author	J. H. Kim, W. Kim, and Y. H. Kim
Journal	Asia Symposium on Quality Electronic Design(Asqed) 2009, Kuala Lumpur, Malaysia
Impact factor	pp. 255 - 258
Year	Jul. 15~16, 2009
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Link	http://ieeexplore.ieee.org/search/srchabstract.jsp?tp=&arnumb… 333회 연결
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