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High-level Statistical Static Timing Analysis under Process Variation
Author	T. H. Kim, W. Kim, J. W. Kim, and Y. H. Kim
Journal	The 12th International Symposium on Integrated Circuits (ISIC-2009), Singapore
Impact factor	pp. 421 - 424
Year	Dec. 14~16, 2009
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Link	http://ieeexplore.ieee.org/search/srchabstract.jsp?tp=&arnumb… 373회 연결
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이전글Evaluation of the State-of-the Art Statistical Leakage Estimation Methods using the BSIM4 Transistor Model 18.12.27
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