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Evaluation of the State-of-the Art Statistical Leakage Estimation Methods using the BSIM4 Transistor Model
Author	J.-W. Kim, W. Kim, and Y. H. Kim
Journal	The 12th International Symposium on Integrated Circuits (ISIC-2009), Singapore
Impact factor	pp. 409 - 412
Year	Dec. 14~16, 2009
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Link	http://ieeexplore.ieee.org/search/srchabstract.jsp?tp=&arnumb… 330회 연결
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