Conference
CAD & SoC Design Laboratory

Conference

An Optimal Operating Point By Using Error Monitoring Circuits with An Error-Resilient Technique
Author Jaemin Lee, Seungwon Kim, Youngmin Kim and Seokhyeong Kang
Journal Proc. IFIP/IEEE International Conference on Very Large Scale Integration
Impact factor pp.69-73
Year 2015
Category
File 첨부 An_optimal_operating_point_by_using_error_monitoring_circuits_with_an_error-resilient_technique.pdf (1.4M) 7회 다운로드 DATE : 2025-08-05 15:54:06
Link 관련링크 https://ieeexplore.ieee.org/document/7314394 271회 연결

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