| An Optimal Operating Point By Using Error Monitoring Circuits with An Error-Resilient Technique | |
|---|---|
| Author | Jaemin Lee, Seungwon Kim, Youngmin Kim and Seokhyeong Kang |
| Journal | Proc. IFIP/IEEE International Conference on Very Large Scale Integration |
| Impact factor | pp.69-73 |
| Year | 2015 |
| Category | |
| Link |
https://ieeexplore.ieee.org/document/7314394
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