Conference
CAD & SoC Design Laboratory

Conference

An Optimal Operating Point By Using Error Monitoring Circuits with An Error-Resilient Technique
Author Jaemin Lee, Seungwon Kim, Youngmin Kim and Seokhyeong Kang
Journal Proc. IFIP/IEEE International Conference on Very Large Scale Integration
Impact factor pp.69-73
Year 2015
Category
Link 관련링크 https://ieeexplore.ieee.org/document/7314394 404회 연결

Our submission to VLSI-SOC 2015, "An Optimal Operating Point By Using Error Monitoring Circuits with An Error-Resilient Technique" authored by Jaemin Lee, Seungwon Kim, Youngmin Kim and Seokhyeong Kang has been accepted.