Conference
CAD & SoC Design Laboratory

Conference

A Novel Design Methodology for Error-resilient Circuits in Near-threshold Computing
Author Jaemin Lee, Sunmean Kim, Youngmin Kim and Seokhyeong Kang
Journal Proc. IEEE International Conference on Consumer Electronics-Asia
Impact factor pp. 1-4
Year 2016
Category
Link 관련링크 https://ieeexplore.ieee.org/document/7804807 396회 연결

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