Journal
CAD & SoC Design Laboratory

Journal

Additive Statistical Leakage Analysis Using Exponential Mixture Model
Author Hyunjeong Kwon, Sung-Yun Lee, Young Hwan Kim, Seokhyeong Kang
Journal IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)
Impact factor
Year 2020
Category
File 첨부 Additive_Statistical_Leakage_Analysis_Using_Exponential_Mixture_Model.pdf (2.9M) 5회 다운로드 DATE : 2025-08-04 23:02:43
Link 관련링크 https://ieeexplore.ieee.org/document/9003274 218회 연결

Our submission to TCAD 2020, "Additive Statistical Leakage Analysis Using Exponential Mixture Model" authored by Hyunjeong Kwon, Sung-Yun Lee, Young Hwan Kim, Seokhyeong Kang has been accepted.