Journal
CAD & SoC Design Laboratory

Journal

Backward Propagated Capacitance Model for Register Transfer Level Power Estimation
Author Jung Yun Choi, Young Hwan Kim, and Kyoung Rok Cho
Journal VLSI Design: An International Journal of Custom-Chip design, Simulation, and Testing
Impact factor Vol. 12, No. 2, pp. 221-231
Year Feb. 2001
Category
Link 관련링크 http://www.hindawi.com/journals/vlsi/2001/078456.abs.html 210회 연결

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