| Statistical Leakage Estimation based on Sequential Addition of Cell Leakage Currents | |
|---|---|
| Author | W. Kim, K. T. Do, Y. H. Kim |
| Journal | IEEE Transactions on Very Large Scale Integration Systems |
| Impact factor | Vol. 18, No. 4, pp. 602-615 |
| Year | Apr. 2010 |
| Category | |
| Link |
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5288541&…
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