| Statistical Leakage Estimation Based on Sequential Addition of Cell Leakage Currents | |
|---|---|
| Author | Wook Kim, Kyung Tae Do, and Young Hwan Kim |
| Journal | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS |
| Impact factor | |
| Year | Feb. 2009 |
| Category | |
| Link |
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5288541
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