Journal
CAD & SoC Design Laboratory

Journal

Efficient Statistical Leakage Analysis Using Deterministic Cell Leakage Models
Author Jae Hoon Kim and Young Hwan Kim
Journal Elsevier Microelectronics Journal
Impact factor Vol. 44, Issue 9, pp. 764-773
Year Sep. 2013
Category
Link 관련링크 http://www.sciencedirect.com/science/article/pii/S0026269213001511 246회 연결

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