Journal
CAD & SoC Design Laboratory

Journal

Variation-Aware SRAM Cell Optimization Using Deep Neural Network-Based Sensitivity Analysis
Author Hyunjeong Kwon, Daeyeon Kim, Young Hwan Kim, Seokhyeong Kang
Journal IEEE Transactions on Circuits and Systems I (TCAS-I)
Impact factor
Year 2021
Category
File 첨부 Variation-Aware_SRAM_Cell_Optimization_Using_Deep_Neural_Network-Based_Sensitivity_Analysis.pdf (2.5M) 4회 다운로드 DATE : 2025-08-05 16:49:58
Link 관련링크 https://ieeexplore.ieee.org/document/9345418 297회 연결

Our submission to TCAS-I, "Variation-Aware SRAM Cell Optimization Using Deep Neural Network-Based Sensitivity Analysis" authored by Hyunjeong Kwon, Daeyeon Kim, Young Hwan Kim, Seokhyeong Kang has been accepted.